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1

Frequency dependence of the lifetime of a surface micromachined microengine driving a load

Danelle M Tanner, William M Miller, Ken A Peterson, Michael T Dugger, William P Eaton, Lloyd W Irwin, Donna C Senft, Norman F Smith, Paiboon Tangyunyong, Samuel L Miller

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 1.73 MB

english, 1999

2

TIVA and SEI developments for enhanced front and backside interconnection failure analysis

E.I. Cole Jr., P. Tangyunyong, D.A. Benson, D.L. Barton

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 738 KB

english, 1999

3

Local thermal probing to detect open and shorted IC interconnections

Edward I. Cole Jr., Paiboon Tangyunyong, Daniel L. Barton

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 440 KB

english, 1999

4

Thermal modeling of localized laser heating in multi-level interconnects

Paiboon Tangyunyong

Journal:

Microelectronics Reliability

Année:

2003

Langue:

english

Fichier:

PDF, 722 KB

english, 2003

5

[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Backside localization of open and shorted IC interconnections

Cole, E.I. Jr., Tangyunyong, P., Barton, D.L.

Année:

1998

Langue:

english

Fichier:

PDF, 1.98 MB

english, 1998

6

[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Resistive interconnection localization

Cole, E.I., Tangyunyong, P., Hawkins, C.F., Bruce, M.R., Bruce, V.J., Ring, R.M., Wan-Loong Chong,

Année:

2002

Langue:

english

Fichier:

PDF, 1.26 MB

english, 2002

7

Anharmonicity in AgBr EXAFS

D.R. Batchelor, P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Solid State Communications

Année:

1995

Langue:

english

Fichier:

PDF, 299 KB

english, 1995

8

SEXAFS study of AgBr(111) and (100) surfaces and comparison to theoretical models

P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Surface Science Letters

Année:

1991

Langue:

english

Fichier:

PDF, 70 KB

english, 1991

9

Fluorescent microthermal imaging — Theory and methodology for achieving high thermal resolution images

D.L. Barton, P. Tangyunyong

Journal:

Microelectronic Engineering

Année:

1996

Langue:

english

Fichier:

PDF, 571 KB

english, 1996

10

Bonding, structure and compositional distribution in sheet crystal silver iodobromide (111)

P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington, S.P. Lovell

Journal:

Applied Surface Science

Année:

1993

Langue:

english

Fichier:

PDF, 935 KB

english, 1993

11

Surface structure studies of silver bromide(111) and (320) using fluorescence SEXAFS

P. Tangyunyong, T.N. Rhodin, R. Ozer, D. Batchelor, Y.T. Tan, K.J. Lushington

Journal:

Physica B: Condensed Matter

Année:

1989

Langue:

english

Fichier:

PDF, 244 KB

english, 1989

12

Fluorescence SEXAFS study of the bromination of the silver(110) surface

D.R. Batchelor, P. Tangyunyong, R. Ozer, T.N. Rhodin, Y.T. Tan, K.J. Lushington, D.A. King

Journal:

Physica B: Condensed Matter

Année:

1989

Langue:

english

Fichier:

PDF, 164 KB

english, 1989

13

Anharmonic corrections in EXAFS from AgBr

D.R. Batchelor, P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Physica B: Condensed Matter

Année:

1995

Langue:

english

Fichier:

PDF, 119 KB

english, 1995

14

Issues for single-event proton testing of SRAMs

Schwank, J.R., Dodd, P.E., Shaneyfelt, M.R., Feli, J.A., Hash, G.L., Ferlet-Cavrois, V., Paillet, P., Baggio, J., Tangyunyong, P., Blackmore, E.

Journal:

IEEE Transactions on Nuclear Science

Année:

2004

Langue:

english

Fichier:

PDF, 594 KB

english, 2004

15

SEXAFS study of AgBr(111) and (100) surfaces and comparison to theoretical models

P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Surface Science

Année:

1991

Langue:

english

Fichier:

PDF, 1.09 MB

english, 1991

16

[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Optical tools and techniques for failure analysis of modern integrated circuits

Cole, E.I., Bruce, M.R., Barton, D.L., Tangyunyong, P., Bruce, V.J., Hawkins, C.F., Soden, J.M., Henderson, C.L., Ring, R.M., Chong, W.-L., Eppes, D.H., Wilcox, J., Benson, D.A.

Année:

2003

Langue:

english

Fichier:

PDF, 168 KB

english, 2003

17

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Fault localization and failure modes in microsystems-enabled photovoltaic devices

Yang, B. B., Cruz-Campa, J. L., Haase, G. S., Tangyunyong, P., Cole, Edward I., Pimentel, A. A., Resnick, P. J., Okandan, M., Nielson, G. N.

Année:

2013

Langue:

english

Fichier:

PDF, 1.42 MB

english, 2013

18

[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Soft defect localization (SDL) in integrated circuits using laser scanning microscopy

Bruce, M.R., Bruce, V.J., Eppes, D.H., Wilcox, J., Cole, E.I., Tangyunyong, P., Hawkins, C.F., Ring, R.

Année:

2003

Langue:

english

Fichier:

PDF, 238 KB

english, 2003

19

Nanometer-scale mechanics of gold films

Tangyunyong, P., Thomas, R. C., Houston, J. E., Michalske, T. A., Crooks, R. M., Howard, A. J.

Journal:

Physical Review Letters

Année:

1993

Langue:

english

Fichier:

PDF, 921 KB

english, 1993

20

Method for the study of semiconductor device operation using scanning capacitance microscopy

Nakakura, C. Y., Tangyunyong, P., Hetherington, D. L., Shaneyfelt, M. R.

Journal:

Review of Scientific Instruments

Année:

2003

Langue:

english

Fichier:

PDF, 698 KB

english, 2003

21

[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects

Cole, E.I., Soden, J.M., Tangyunyong, P., Candelaria, P.L., Beegle, R.W., Barton, D.L., Henderson, C.L., Hawkins, C.F.

Année:

1997

Langue:

english

Fichier:

PDF, 733 KB

english, 1997

22

Product development and yield enhancement through failure analysis of integrated circuits with scanning capacitance microscopy

Tangyunyong, P., Nakakura, C. Y.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Année:

2003

Langue:

english

Fichier:

PDF, 912 KB

english, 2003

23

Failure Analysis Techniques for Microsystems-Enabled Photovoltaics

Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Cole, Edward I., Tangyunyong, Paiboon, Resnick, Paul J., Kilgo, Alice C., Okandan, Murat, Nielson, Gregory N.

Journal:

IEEE Journal of Photovoltaics

Année:

2014

Langue:

english

Fichier:

PDF, 709 KB

english, 2014

24

Identification of radiation-induced parasitic leakage paths using light emission microscopy

Shaneyfelt, M.R., Paiboon Tangyunyong,, Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.

Journal:

IEEE Transactions on Nuclear Science

Année:

2004

Langue:

english

Fichier:

PDF, 737 KB

english, 2004

25

[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - The effect of frequency on the lifetime of a surface micromachined microengine driving a load

Tanner, D.M., Miller, W.M., Eaton, W.P., Irwin, L.W., Peterson, K.A., Dugger, M.T., Senft, D.C., Smith, N.F., Tangyunyong, P., Miller, S.L.

Année:

1998

Langue:

english

Fichier:

PDF, 2.75 MB

english, 1998

26

[IEEE 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC) - Denver, CO, USA (2014.6.8-2014.6.13)] 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) - Stress factor assessment for microsystems-enabled photovoltaics

Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Tangyunyong, Paiboon, Okandan, Murat, Nielson, Gregory N.

Année:

2014

Langue:

english

Fichier:

PDF, 772 KB

english, 2014

27

Substrate effects on the nanometer-scale mechanics of gold films

Tangyunyong, P., Thomas, R.C., Houston, J.E., Michalske, T.A., Crooks, R.M., Howard, A.J.

Journal:

Journal of Adhesion Science and Technology

Année:

1994

Langue:

english

Fichier:

PDF, 5.23 MB

english, 1994

28

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Monday 18 September 2000)] MEMS Reliability for Critical Applications - Electrostatic discharge/electrical overstress susceptibility in MEMS: a new failure mode

Walraven, Jeremy A., Soden, Jerry M., Tanner, Danelle M., Tangyunyong, Paiboon, Cole, Jr., Edward I., Anderson, Richard E., Irwin, Lloyd W., Lawton, Russell A.

Année:

2000

Langue:

english

Fichier:

PDF, 1.80 MB

english, 2000

29

Chemically-sensitive interfacial force microscopy: Contact potential measurements of self-assembling monolayer films

Thomas, R. C., Tangyunyong, P., Houston, J. E., Michalske, T. A., Crooks, R. M.

Journal:

Journal of Physical Chemistry

Année:

1994

Langue:

english

Fichier:

PDF, 873 KB

english, 1994

30

Thermal modeling of a polysilicon-metal test structure used for thermally induced voltage alteration characterization

P. Tangyunyong, D. Benson, E. I. Cole

Année:

2000

Langue:

english

Fichier:

PDF, 1.13 MB

english, 2000

31

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Sunday 20 September 1998)] Materials and Device Characterization in Micromachining - Failure analysis of surface-micromachined microengines

Peterson, Kenneth A., Tangyunyong, Paiboon, Pimentel, Alejandro A., Friedrich, Craig R., Vladimirsky, Yuli

Année:

1998

Langue:

english

Fichier:

PDF, 1.93 MB

english, 1998

32

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Sunday 20 September 1998)] Materials and Device Characterization in Micromachining - Linkage design effect on the reliability of surface-micromachined microengines driving a load

Tanner, Danelle M., Peterson, Kenneth A., Irwin, Lloyd W., Tangyunyong, Paiboon, Miller, William M., Eaton, William P., Smith, Norman F., Rodgers, M. Steven, Friedrich, Craig R., Vladimirsky, Yuli

Année:

1998

Langue:

english

Fichier:

PDF, 1.29 MB

english, 1998

33

Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques

Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.

Journal:

Journal of Applied Physics

Année:

2016

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2016

34

Diagnosis of Factors Impacting Yield in Multilayer Devices for Superconducting Electronics

Missert, Nancy, Jenkins, Mark W., Tangyunyong, Pai, Mook, William, Vernik, Igor V., Kirichenko, Alex F., Mukhanov, Oleg A., Wynn, Alex, Day, Alexandra L., Bolkhovsky, Vladimir, Johnson, Leonard M.

Journal:

IEEE Transactions on Appiled Superconductivity

Année:

2019

Langue:

english

Fichier:

PDF, 2.88 MB

english, 2019